 COMBINED TRANSMISSION AND STREAMING MULTI-VIEW IMAGING SYSTEM
专利摘要:
combined transmission and scattering multi-view imaging system. the present specification describes a multi-view x-ray inspection system having, in one of several embodiments, a three-view configuration with three x-ray sources. each x-ray source rotates and is configured to emit a rotating x-ray pencil beam and at least two detector arrays, wherein each detector array contains multiple non-pixeled detectors such that at least a portion of the non-pixeled detectors are oriented towards both x-ray sources. 公开号:BR112014019198A2 申请号:R112014019198-0 申请日:2013-01-31 公开日:2021-09-08 发明作者:Edward James Morton 申请人:Rapiscan Systems, Inc.； IPC主号:
专利说明:
[001] [001] The present application is based on Provisional Patent Application No. US 61/594,625, filed February 3, 2012 for priority. The aforementioned application is incorporated herein by reference. FIELD OF THE INVENTION [002] [002] The present specification refers generically to the field of X-ray imaging system for security scanning and more specifically to multi-view X-ray scanning systems which advantageously combine backscatter and transmission imaging. FUNDAMENTALS [003] [003] With the proliferation of terrorism and commercial smuggling, there is an imminent need for systems that can effectively and efficiently track cars, buses, larger vehicles and cargo to detect unknown threats and illegal substances. [004] [004] In the past, many technologies have been evaluated for use in security inspection, and often X-ray imaging has been identified as a reasonable technique for such purposes. Several known X-ray scanning systems have been deployed to track cars, buses and other vehicles. These systems include backscatter and transmission X-ray tracking systems. These prior art X-ray systems provide scanning from a very limited number of orientations, usually one and potentially two. For example, a broadcast X-ray system can be configured in a side shooter or top shooter configuration. Backscatter systems may be available in a single-sided configuration or, occasionally, in a three-sided configuration. [005] [005] Accordingly, there is a need in the prior art for a multi-view imaging system that can have an arbitrary number of views, and typically more than one. There is also a need in the art for a modular multi-view system that results in high detection performance at very low doses using a combination of backscatter and transmission imaging methodologies. SUMMARY OF THE INVENTION [006] [006] The present specification describes, in one embodiment, an X-ray inspection system comprising an X-ray source configured to emit an X-ray beam; and a detector array comprising a plurality of non-pixeled detectors, wherein at least a portion of said non-pixeled detectors are not oriented towards the X-ray source. [007] [007] In another embodiment, the present specification describes an X-ray inspection system comprising at least two X-ray sources, wherein each X-ray source is configured to emit an X-ray beam; and at least two detector arrays, wherein each detector array comprises a plurality of non-pixeled detectors, wherein at least a portion of said non-pixeled detectors are oriented towards the two x-ray sources. [008] [008] In yet another embodiment, the present specification describes a multi-view X-ray inspection system having a three-view configuration comprising three X-ray sources, wherein each X-ray source rotates and is configured to emit a beam. rotating X-ray pencil; and, at least two detector arrays, each detector array comprising a plurality of non-pixeled detectors, wherein at least a portion of said non-pixeled detectors are oriented towards the two x-ray sources. [009] [009] In one embodiment, the X-ray beam is a pencil beam and each X-ray source rotates along an angle of rotation, and the X-ray inspection system has an intrinsic spatial resolution and at that resolution Intrinsic space is determined by a certain degree of collimation of the X-ray beam and not by a degree of pixelation of X-ray scan data. Furthermore, in one embodiment, a single detector is exposed to a single X-ray beam at a from one of said X-ray sources at a given point in time, and each detector defines a plane and in which said plane is offset from each plane defined by each X-ray source. In one embodiment, each detector has a rectangular shape . [0010] [0010] In another embodiment of the present invention, the X-ray inspection system comprises at least one X-ray source configured to emit an X-ray beam; and a detector array comprising at least two rectangular profile backscatter detectors and a square profile transmission detector positioned between said at least two rectangular profile backscatter detectors. [0011] [0011] In yet another embodiment, the present specification describes an X-ray inspection system comprising at least one X-ray source configured to emit an X-ray beam; and a detector array comprising at least two rectangular profile backscatter detectors, a square profile transmission detector positioned between said at least two rectangular profile backscatter detectors, and a pair of fixed collimators positioned between the profile transmission detector square and one of said at least two rectangular profile backscatter detectors. [0012] [0012] In one embodiment, an X-ray inspection system comprising a control system, wherein, when said X-ray inspection system is activated to detect gamma rays, said control system turns off the X-ray source and switches a detector data processing mode from current integrating mode to pulse counting mode is disclosed. [0013] [0013] In another embodiment, the present invention describes an X-ray inspection system having at least one X-ray source, wherein said X-ray source comprises an extended anode X-ray tube, a rotating collimator assembly , a bearing, a drive motor, and a rotary encoder. [0014] [0014] In yet another embodiment, the present invention describes an X-ray inspection system having at least one X-ray source, wherein said X-ray source comprises an extended anode X-ray tube, a rotating collimator, a bearing, a drive motor, a secondary collimator assembly, and a rotary encoder. [0015] [0015] In one embodiment, an X-ray inspection system comprising a control system wherein said control system receives velocity data and wherein said control system adjusts at least one of the collimator rotational velocity from a source of X-ray, data acquisition velocity, or X-ray tube current based on said velocity data, is disclosed. [0016] [0016] In another embodiment, the present specification describes an X-ray inspection system comprising a control system wherein said control system adjusts at least one of a collimator rotation speed of an X-ray source, data acquisition, or X-ray tube current to ensure a uniform dose per unit length of an object being scanned. [0017] [0017] The present specification is also directed to an X-ray inspection system for scanning an object, the inspection system comprising: at least two rotating X-ray sources configured to simultaneously emit rotating X-ray beams, each of said X-ray beams defining a transmission path; at least two detector arrays, wherein each of said at least two detector arrays is positioned opposite one of the at least two x-ray sources to form a scanning area; and at least one controller for controlling each of the X-ray sources to scan the object in a coordinated manner so that the X-ray beams from the at least two X-ray sources do not cross transmission paths. [0018] [0018] In one embodiment, each of the emitted X-ray beams is a pencil beam and each X-ray source rotates through a predetermined rotation angle. [0019] [0019] In one embodiment, each detector is a non-pixeled detector. [0020] [0020] In one embodiment, a first, second and third rotating X-ray sources are configured to simultaneously emit rotating X-ray beams, wherein the first X-ray source scans the object by starting in a substantially vertical position and moving in a clockwise mode; wherein the second X-ray source scans the object by starting in a substantially vertical downward position and moving in a clockwise fashion; and wherein the third X-ray source scans the object by starting in a substantially horizontal position and moving in a clockwise fashion. [0021] [0021] In one embodiment, the controller causes each of the X-ray sources to begin scanning the object in a direction that does not overlap with an initial scan direction of any of the remaining X-ray sources, thus eliminating interference between X-ray sources. [0022] [0022] In one embodiment, a plurality of scanned views of the object are collected simultaneously with each of the detectors being irradiated by no more than one X-ray beam at any one time. [0023] [0023] In one embodiment, a volume of detectors is independent of a certain number of scanned views of the obtained object. [0024] [0024] In one embodiment, the X-ray inspection system has an intrinsic spatial resolution wherein said intrinsic spatial resolution is determined by a certain degree of collimation of an X-ray beam. [0025] [0025] In one embodiment, the one or more detectors comprise an array of scintillator detectors having one or more photomultiplier tubes emerging from an edge of the detector array to allow X-ray beams from adjacent X-ray sources to pass a unobstructed face of the detector array in front of the photomultiplier tubes. [0026] [0026] In one embodiment, the one or more detectors are formed from a bar of scintillation material that has a high light emission efficiency, a fast response time, and is mechanically stable over large volumes with little response to changing environmental conditions. [0027] [0027] In one embodiment, the one or more detectors are gas ionization detectors comprising a Xenon or any other pressurized gas. [0028] [0028] In one embodiment, the one or more detectors are formed from a semiconductor material, such as, but not limited to, CdZnTe, CdTe, HgI, Si and Ge. [0029] [0029] In one embodiment, the X-ray inspection system is configured to detect gamma rays by turning off the X-ray sources by switching the detectors from a current integrating mode to a pulse counting mode. [0030] [0030] The present specification is also directed to an X-ray inspection system for scanning an object, the inspection system comprising: at least two X-ray sources configured to simultaneously emit rotating X-ray beams to irradiate the object wherein each of said X-ray beams defines a transmission path; a detector array comprising at least one transmission detector positioned between at least two backscatter detectors, wherein each of said backscatter detectors detects backscattered X-rays emitted by a first X-ray source positioned on a first side of the object and wherein the transmission detectors detect transmitted X-rays emitted by a second X-ray source positioned on an opposite side of the object; and at least one controller for controlling each of the X-ray sources to simultaneously scan the object in a coordinated, non-overlapping manner, such that the transmission paths of each of said X-ray beams do not cross. [0031] [0031] In one embodiment, the array of detectors comprises at least two rectangular profile backscatter detectors and a square profile transmission detector positioned between said at least two rectangular profile backscatter detectors. [0032] [0032] In another embodiment, the detector array comprises a transmission detector positioned between two backscatter detectors, wherein the detectors are positioned within a single plane facing the object being scanned and the transmission detector has an area of exposed surface smaller than each of the backscatter detectors. [0033] [0033] In one embodiment, the X-ray inspection system further comprises a pair of fixed collimators positioned between the transmission detector and one of said at least two backscatter detectors. [0034] [0034] In one embodiment, each of the X-ray sources comprises an extended anode X-ray tube, a rotating collimator, a bearing, a drive motor, and a rotary encoder. [0035] [0035] In another embodiment, each of the X-ray sources comprises: an extended anode X-ray tube coupled with a cooling circuit, the anode being at ground potential; a rotating collimator comprising at least one collimation ring with grooves cut at predefined angles around a circumference of the collimator, a length of each groove being greater than a groove width and axis of rotation, and the width of the grooves defining a intrinsic spatial resolution of the X-ray inspection system in the scan direction; a bearing for supporting a weight of the collimator assembly and transferring a drive shaft from the collimator assembly to a drive motor; a rotary encoder for determining an absolute angle of rotation of the x-ray beams; and a secondary collimator assembly to improve spatial resolution in a perpendicular scan direction. [0036] [0036] In one embodiment, the controller receives velocity data comprising an object velocity and, based on such velocity data, adjusts at least one of a collimator rotational velocity of an X-ray source, an acquisition rate of data, or an X-ray tube stream based on said velocity data. [0037] [0037] The above mentioned and other embodiments will be described in more detail in the drawings and detailed description provided below. BRIEF DESCRIPTION OF THE DRAWINGS [0038] [0038] These and other features and advantages of the present invention will be appreciated as they become better understood by reference to the following detailed description when considered in connection with the accompanying drawings: [0039] [0039] Figure 1 shows a single view sniper transmission imaging system in accordance with an embodiment of the present invention; [0040] [0040] Figure 2 is a first side shooter configuration of an embodiment of the present invention; [0041] [0041] Figure 3 depicts a second side shooter configuration of an embodiment of the present invention; [0042] [0042] Figure 4 is a multi-view X-ray imaging system embodying the present invention; [0043] [0043] Figure 5 shows an X-ray detector geometry offset from a plane of X-ray sources for use in the multi-view X-ray imaging system of the present invention; [0044] [0044] Figure 6 shows an embodiment of an X-ray detector suitable for use in the multi-view system of the present invention; [0045] [0045] Figure 7a is a side view of an array of detectors for use in the multi-view system of the present invention; [0046] [0046] Figure 7b is an end view of the array of detectors for use in the multi-view system of the present invention; [0047] [0047] Figure 8 shows one embodiment of a backscatter-transmission detector configuration for use with the multi-view system of the present invention; [0048] [0048] Figure 9 shows an alternative embodiment of the backscatter-transmission detector configuration for use with the multi-view system of the present invention; [0049] [0049] Figure 10 shows an embodiment of a scanning X-ray source suitable for use with the multi-view system of the present invention; [0050] [0050] Figure 11a shows a secondary collimator set to improve the spatial resolution in the perpendicular direction; [0051] [0051] Figure 11b shows the secondary collimator assembly of Figure 11a positioned around an outer edge of a rotating collimator; [0052] [0052] Figure 12 shows an electronic reading circuit embodiment for use with detectors of the multi-view system of the present invention; [0053] [0053] Figure 13 shows a matrix configuration where a set of 'n' multi-view imaging systems are monitored by a group of 'm' image inspectors; [0054] [0054] Figure 14 shows an implementation of a multi-view imaging system for scanning load, according to an embodiment of the present invention; [0055] [0055] Figure 15 shows an implementation of a multi-view imaging system for scanning occupied vehicles in accordance with an embodiment of the present invention; [0056] [0056] Figure 16a shows a mobile inspection system in its operational state ready for scanning; [0057] [0057] Figure 16b shows the step of bending the vertical bar over a pivot point at the end of the horizontal bar; [0058] [0058] Figure 16c shows the step of bending the horizontal bar and simultaneously the vertical bar around a pivot point on top of a vertical support; [0059] [0059] Figure 16d shows the step of establishing the vertical bar towards the back of the mobile inspection vehicle; [0060] [0060] Figure 16e shows the step of bending the background image section by at least 90 degrees from its operating position; [0061] [0061] Figure 16f shows the step of bending an outer horizontal base section by 180 degrees to make it parallel to the inner base section; and [0062] [0062] Figure 16g shows the step of completely bending the base section by 90 degrees to complete the system wrapping. DETAILED DESCRIPTION OF THE INVENTION [0063] [0063] The present specification is directed to an X-ray scanning system that advantageously combines image information from both backscatter and transmission technologies. More specifically, the present invention uses four discrete backscatter systems, yet reuses the pencil beam from one backscatter system to illuminate large area detectors from a second backscatter system so that simultaneous multi-sided transmission and backscatter imaging using the same set of four X-ray beams can be achieved. This approach is cost effective in that it saves the cost of a segmented array of detectors and still provides a complete inspection. [0064] [0064] The present specification is addressed to various embodiments. The following description is provided to enable a person of current skill in the art to practice the invention. Language used in the present specification should not be interpreted as a general disclaimer of any specific embodiment, or used to limit claims beyond the meaning of the terms used herein. The general principles defined herein can be applied to other embodiments and applications without departing from the spirit and scope of the invention. In addition, the terminology and phraseology used are intended to describe exemplary embodiments and should not be construed as limiting. Thus, the present invention should be given the broadest scope encompassing numerous alternatives, modifications and equivalents consistent with the principles and features described. For the sake of clarity, details regarding technical material which is known in the technical fields related to the present invention have not yet been described in detail so as not to unnecessarily obscure the present invention. [0065] [0065] Figure 1 shows a single view sniper transmission imaging system 100, in accordance with an embodiment of the present invention. System 100 comprises an X-ray source 105 with a rotating pencil beam collimator. When the X-ray beam is turned on, the collimator rotates continuously to form a moving X-ray beam 110 that scans a fan-shaped area. [0066] [0066] An X-ray scan image of the object 125 is formed by recording the signal strength at the output of each detector 120 at all times, as well as the angle of rotation of the X-ray pencil beam 110. In In radial coordinates, object X-ray transmission is determined by plotting the X-ray intensity recorded from X-ray detectors 120 being pointed by X-ray beam 110 against its angle of rotation at any given instant. As known to those of ordinary skill in the art a predetermined coordinate transform maps this data back to a Cartesian grid or any other chosen coordinate grid. [0067] [0067] In contrast to typical prior art X-ray imaging systems, the intrinsic spatial resolution of the system 100 is not determined by pixelation of the X-ray scan data, but by the collimation of the X-ray beam 110 at the source 105 Since the X-ray beam 110 is produced from a small focal point with a finite area, the X-ray pencil beam 110 is divergent and therefore the spatial resolution of the system 100 varies with distance from the sensors 120 from source 105. Thus, spatial resolution of system 100 is lowest in the lower corners directly opposite X-ray source 105. However, this variable spatial resolution is corrected by deconvolution of the spatial impulse response of system 100, as a function of the angle of rotation to thus produce an image with constant perceptible spatial resolution. [0068] [0068] Figure 2 is a side shooter configuration, of the system 100 of Figure 1, utilizing a similar identical X-ray source 205 with a rotating pencil beam 210 and an identical X-ray detector array. [0069] [0069] Figure 4 is a multi-view X-ray imaging system 400 incorporating the configurations of Figures 1 to 3, in accordance with an embodiment of the present invention. In one embodiment, system 400 has a three-view configuration enabled by three simultaneously active rotating X-ray beams 405, 406, and 407 with a plurality of detectors correspondingly placed, in one embodiment, in transmission configuration to form a tunnel of scan 420. System 400 provides a high degree of inspection capability, in accordance with an object of the present invention, while at the same time achieving substantially lower X-ray dose since the volume of space irradiated at any point in time is low compared to conventional prior art line scanning systems which typically have a large number of pixelated X-ray detectors and fan-beam X-ray irradiation. [0070] [0070] As shown in Figure 4, there is almost no interference between the three X-ray images, which are collected simultaneously because X-ray sources 405, 406, 407 are controlled by at least one controller 497, which can be local or remote from X-ray sources 405, 406, 407, which transmits control signals to each X-ray source 405, 406, 407 in a manner that causes them to scan the target object 495 in a coordinated, rather than overlapping, fashion. In one embodiment, the X-ray source 405 scans object 495 by starting in a substantially vertical position (between 12:00 and 01:00) and moving in a clockwise fashion. At the same time, X-ray source 406 scans object 495 by starting in a substantially downward vertical position (about 4:00 am) and moving in a clockwise fashion. At the same time, X-ray source 407 scans object 495 by starting in a substantially horizontal position (about 9:00) and moving in a clockwise fashion. It should be noted that each of the aforementioned X-ray sources may start at a different position, provided that a) each starts a scan in a direction that does not overlap with the initial scan direction of the other X-ray sources and b) each scans in a direction and at a speed that does not substantially overlap with the scan of other X-ray sources. [0071] [0071] In accordance with one aspect of the present invention, there is almost no limit to the number of views that can be collected at the same time in the system 400, with each detector segment 421 being radiated by no more than one beam of rays. Primary X at any given time. In one embodiment, the detector configuration 430, shown in Figure 4, comprises 12 detector segments 421 each approximately 1m in length to form an inspection tunnel of approximately 3m (width) x 3m (height). In one embodiment, the detector configuration 430 is capable of supporting six independent X-ray views to allow transition of raster X-ray views between adjacent detectors. An alternative embodiment comprising 0.5m long detector segments 421 is capable of supporting up to 12 independent X-ray image views. [0072] [0072] Persons of ordinary skill in the art should appreciate that in the 400 system the volume of detector material is independent of the number of views to be collected and the density of display electronics is quite low compared to detector arrays of conventional prior art pixelated X-rays. Furthermore, a plurality of x-ray sources can be driven from an appropriately rated high voltage generator allowing additional x-ray sources to be added relatively simply and conveniently. These features allow the high density multi-view system 400 of the present invention to be used to advantage in security screening applications. [0073] [0073] As shown in Figure 5, a multiple view system such as the one shown in Figure 4 has X-ray detectors 520 offset from the plane of X-ray sources 505. The offset prevents X-ray beams 510 from are absorbed relatively strongly at the detector closest to it, before the beam can enter the object under inspection. [0074] [0074] According to another aspect, X-ray detectors are not required to have a spatial resolution function and thus allowing the primary beam to travel over the face of the detector, and to a side face of the detector, with an impact minimum in the overall performance of the imaging system. This considerably simplifies the detector setup over a conventional prior art pixelated X-ray system, since, in a pixelated system, each detector has to be oriented to point back towards a corresponding source to maintain resolution. space. Thus, in prior art pixelated X-ray systems, a single detector may not point to more than one source position and therefore a dedicated pixel array is required for each source point. [0075] [0075] Figure 6 shows an embodiment of an appropriate X-ray detector 600 for use in a multi-view system (such as the three-view system 400 of Figure 4) of the present invention. As shown, detector 600 is formed from a bar 605 of X-ray detection material, which in one embodiment is manufactured from scintillation material. In a scintillation process, X-ray energy is converted to optical photons and these photons are collected using a suitable optical detector such as a photomultiplier tube or photodiode 610. Suitable scintillation detection materials include plastic scintillators, CsI, BGO , NaI, or any other scintillation materials known to persons skilled in the art that have high light emission efficiency, fast response time, and are mechanically stable at large volumes with little response to changing environmental conditions. Alternatively, detector materials may also comprise gas ionization and gas proportional detectors, preferably with pressurized gas to improve detection efficiency and high electric field strengths to improve signal collection times. Noble gas based detectors such as pressurized xenon detectors are well suited for use with the multi-view system of the present invention. Semiconductor detector materials could also be adopted, such as CdZnTe, CdTe, HgI, Si and Ge, although the capacitance, response time, costs and response temperature of these materials make them a less preferred option. [0076] [0076] An array of scintillating detectors 720 is shown in Figures 7a and 7b with photomultiplier tubes 725 emerging from the same long edge of scintillating material to allow X-ray beams from adjacent X-ray sources to pass the unobstructed face of the forward detector. to photomultiplier tubes 725. Two X-ray sources 705, 706 are visible in the side view of detector array 720 of Figure 7a. Three X-ray sources 705, 706, 707 are visible in the end view of Figure 7b. [0077] [0077] Of the X-rays that are transmitted directly through an object and to a set of transmission detectors on the opposite side of the object, a fraction of the X-rays scatters from the object in other directions. It is known to those skilled in the art that the probability of detecting a scattered X-ray varies as an inverse square of the distance of the detector from the scattering site. This means that a detector placed in close proximity to an X-ray beam, once it enters the object, will receive a much larger backscatter signal than a detector placed at a significant distance from the X-ray source. [0078] [0078] Figure 8 shows an embodiment of a detector configuration for use with the multi-view system of the present invention to use backscattered X-rays from an object under inspection in addition to transmitted X-rays. In this embodiment, an X-ray source 805 illuminates object 825 with a scanning pencil beam 810 of X-rays. A fraction of the X-rays 815 backscatter, which are then detected by a pair of rectangular detectors 821, 822. X-ray beam 830 from a second X-ray source (not shown) on the other side of object 825 is captured on a smaller square-section detector 835. [0079] [0079] It should be noted here that the sensors can be of any shape and are not limited to a rectangular shape. In this particular embodiment, a rectangular shape is selected because it produces a uniform response and is relatively inexpensive to manufacture. Also, a rectangular shape is easier to stack end to end compared to a circular or other curved detector. Likewise, using a smaller square cross-section is likely to produce the most uniform response, for example, when compared to a cylindrical detector with a circular cross-section, and is relatively lower in manufacturing cost. [0080] [0080] The square profile transmission detector 835 is placed between the two rectangular profile backscatter detectors 821, 822. A pair of fixed collimators 840 substantially reduces the effect of scattered radiation on the transmission detector 835, resulting from a nearby X-ray source, which measures relatively weak transmission signals from the opposite X-ray source (not shown). All 821, 822 and 835 detectors are shielded using suitable materials such as steel and lead around all faces except their active faces to prevent background signal due to natural gamma radiation and unwanted X-ray scattering. Therefore, a transmission detector is sandwiched between two backscatter detectors within a single plane facing the object being scanned, and the transmission detector has a smaller exposed surface area than each of the backscatter detectors. [0081] [0081] Figure 9 shows an alternative embodiment of combined X-ray backscatter-transmission detectors. Here, a large imaging panel 900, which in one embodiment ranges from 1.5 m to 3.0 m in total length, comprises six individual X-ray detectors, plus a scanning X-ray source 905. Four of the detectors 910, 911, 912 and 913 are used for recording X-ray backscatter from the local X-ray source 905, while two detectors 914, 915 having smaller exposed surface areas than each of the backscatter detectors 910, 911, 912, 913 are used to record transmit X-ray signals from an opposing X-ray generator. [0082] [0082] Persons of ordinary skill in the art will appreciate that with the detector formations of Figures 8 and 9, a multi-view backscatter system of the present invention is achieved that has a backscatter view corresponding to each transmission view. [0083] [0083] According to another aspect, transmission imaging detectors can also be used to record backscatter signals when not being directly radiated by a transmission imaging beam. However, use of additional detection sensors, as shown in Figures 8 and 9, substantially improves the sensitivity of the backscatter detectors albeit at substantially higher costs. Therefore, a low-cost system with modest backscattering performance can be assembled using just a single array of detectors in offset geometry as shown in Figures 5 and 6. [0084] [0084] In one embodiment, additional backscatter imaging panels are formed from a low cost, high volume detector material, such as scintillation materials comprising plastic scintillators, scintillation screens such as GdO2S with scintillation guides. optical lights, and solid scintillators such as CsI and NaI although any scintillator known to those skilled in the art can be used, provided it has a fast response time (primary decay time < 10 µs), good uniformity and stability against changing environmental conditions . Gas-filled and semiconductor detectors can also be used, although these are less preferred, with the exception of pressurized xenon gas detectors. [0085] [0085] In accordance with yet another aspect of the present invention, the large area array of detector panels of Figures 8 and 9 are also used as passive detectors of gamma radiation, such as emitted from special nuclear materials and other radioactive sources. of interest, such as Co-60, Cs-137 and Am-241. To activate system sensitivity to passive gamma rays, the X-ray sources are turned off and the detector electronics are switched from a current integrating mode to a pulse counting mode. The object, such as a vehicle, under inspection is first scanned with the X-ray system of the present invention. It should be noted here that the method of the present invention can be used in a single-view configuration or a multi-view configuration. If a suspicious item is detected, the vehicle will be rescanned, this time in passive detection mode. This provides dual operational function capability for the imaging system of the present invention. Furthermore, due to the spatial positioning of the detection panels, it is possible to approximately locate a radioactive source in space (recognise the inverse square reduction of the count rate in detectors due to the detector's distance from the source). This location is applied to multi-view X-ray images in the form of a graphic wrapper to show the position of a passive gamma-ray source. [0086] [0086] As shown in Figure 10, one embodiment of a suitable scanning X-ray source 1000 for use with the multiple view system of the present invention comprises an extended anode X-ray tube 1005, a rotating collimator assembly 1010, a bearing 1015, a drive motor 1020 and a rotary encoder 1025. [0087] [0087] In one embodiment, extended anode X-ray tube 1005 has the anode at ground potential. The anode is provided with a cooling circuit to minimize thermal heating of the target during extended operating periods. In one embodiment, a rotating collimator assembly 1010 is advantageously formed from suitable engineering materials such as steel and tungsten. The collimator comprises at least one collimation ring with openings cut at suitable angles around the circumference of the collimator. The length of each slot being longer than its width and longer than its axis of rotation and narrow in the direction of rotation. Slot width defines intrinsic spatial resolution of the transmission imaging system in the scan direction. [0088] [0088] Bearing 1015 supports the weight of the collimator assembly 1010 and transfers a drive shaft from the collimator assembly to a drive motor 1020. The drive motor 1020 is capable of being speed controlled using an electronic servo drive to maintain exact rotation speed. A rotary encoder 1025 provides absolute angle of rotation as this is necessary to determine the position of each sampled detector point in the final generated image. [0089] [0089] The rotating X-ray beam produced by the source 1000 of Figure 10 has good resolution in only one dimension. To improve the spatial resolution in the perpendicular direction, a secondary collimator assembly is provided as shown in Figures 11a and 11b. Referring now to Figures 11a and 11b simultaneously, rim type collimators 1100 are placed around the outer edge of rotating collimator 1110 to provide collimation in the beamwidth direction. Since in one embodiment transmission detectors are likely to be of a square section (such as detectors 835 of Figure 8) and when combined with the offset system geometry of the present invention (as discussed with reference to Figure 5), use of a secondary beamwidth collimator 1110 allows a specific shape of beam to be produced that accurately follows the centerline of the imaging detectors. [0090] [0090] In one embodiment of the present invention, additional collimation is positioned on transmission detectors to limit the X-ray beamwidth before entering the sensing material itself. This allows an image of arbitrary spatial resolution to be collected even if an X-ray beam passing through the real object is of lower intrinsic spatial resolution. The width of the X-ray beam passing through the object is kept as small as possible, but consistent with the final collimator slit width, so as to minimize dose to the object under inspection. [0091] [0091] Each detector in the multi-view system is provided with readout electronics that polarize the photodetector, buffer and amplify the output signal from the photodetector and digitize the resulting signal. Figure 12 shows an embodiment of photomultiplier tube circuit 1205 with buffer amplifier and high speed analog-to-digital converter (ADC). Data 1210 from ADC 1210 is transferred to a system controller circuit 1215 along with digital data from all other photodetectors (DET1, DET2, DETn). System controller 1215 also encoders take data 1220 from each of the X-ray sources and provides motor drive signals 1225 to each X-ray source. Thus, system controller 1215 coordinates data acquisition between each component. of the detector system and generates an image data stream 1230 that provides data individually for each transmit and backscatter X-ray view. [0092] [0092] A set of appropriate sensors 1235 are used to measure the speed of the vehicle or object under inspection as it passes through the inspection region. Suitable sensors comprise microwave radar cameras, scanning infrared lasers and simply inductive sensors placed at a known distance that can provide a measurement of velocity (=distance/time) by comparing the times each sensor goes from false to true and vice versa as when vehicle scans pass. This velocity information, in one embodiment, is passed to the system controller 1215, which then adjusts collimator rotational speed, data acquisition rate, and x-ray tube current to ensure a uniform dose per unit length. of the object being scanned. When using a 1210 high-speed ADC, multiple samples are acquired at each transmit and backscatter source point so that an average value, or otherwise filtered value, is stored to improve the signal-to-noise ratio of the imaging system. . [0093] [0093] The linear scan speed of the X-ray beam along the face of a transmission imaging detector varies as a function of distance from the source (i.e. more distant points undergo a fast linear scan rate). Therefore, in one embodiment, the use of a high-speed oversampling analog-to-digital converter 1210 simplifies the adjustment of sample time to match the linear sweep speed by using, for example, data from encoder 1220 to trigger the start of each sampling period, where the relevant encoder values are stored in a digital lookup table before the start of the scan. High-speed data sampling allows for better deconvolution of spatial resolution in the scan direction by oversampling the measured data and generating lower sample rate output image data compared to what would be achieved by trying to deconvolute just one image of low sample rate. [0094] [0094] According to one embodiment, the system controller 1215 is advantageously designed using a combination of digital electronics, such as a set of programmable field gates, and a microcontroller. Digital circuitry provides the precise timing that is required to build a scanned image from multiple detectors and multiple encoders in an automated fashion, using only data from the 1220 encoders to coordinate activity. One or more microcontrollers provide system configuration capability, in-system programming for in-field firmware upgrades, and support for the final data transmission process. [0095] [0095] One modality uses a matrix configuration where a set of 'n' multi-view imaging systems are monitored by a group of 'm' image inspectors. In this configuration, as shown in Figure 13, each imaging system SYS1, SYS2, ... SYSn is connected to a network 1315 that provides a database 1305 for storing and retrieving all image data. A 1310 task scheduler keeps track of which systems are online and which INSPECT1, INSPECT2, ... INSPECTm operators are available for inspection. Images from the 1305 database are automatically transferred to the next available inspector for review. Inspection results are passed back to the relevant imaging system which advantageously comprises traffic control measures to direct manual search of suspicious vehicles or objects under inspection. System Supervisor 1320 is, in one embodiment, a manager who can monitor the status of imaging systems, monitor the efficiency of operators, and can double-check inspection results from inspectors. [0096] [0096] Figure 14 shows implementation of a multiple-view imaging system for load scanning, in accordance with an embodiment of the present invention, comprising a gantry 1400 with main imaging system (such as the three-view system 400 of Figure 4 ) at its center together with up and down ramps 1410, 1411 respectively provided to allow vehicles to pass through the center of the inspection tunnel [0097] [0097] Figure 15 shows deployment of a multi-view imaging system for scanning occupied vehicles in accordance with an embodiment of the present invention, where vehicles on a multi-lane road 1500 approach a plurality of scanners 1505, one scanner per lane . Vehicles 1525 are scanned as they pass through respective scanners and approach a plurality of corresponding traffic control systems 1510 as a barrier or other suitable traffic control measures, including traffic lights. Decision results from image inspectors are automatically passed to these 1510 traffic control systems, which then hold or divert traffic if necessary. In an illustrative example, a holding area 1515 is shown with a vehicle 1520 parked therein as a result of an inspector/operator marking a scanned image of vehicle 1520 as suspicious. [0098] [0098] In another aspect, the multi-view imaging system of the present invention is deployed in the form of a mobile inspection vehicle for rapid relocation to an inspection site. Figure 16a shows mobile inspection system 1600 in its ready-to-sweep operational state. Vehicle 1605 carries an embodiment of a multi-view detection system, where a scanning tunnel 1610 is surrounded by a set of bars 1615, 1621, 1622. [0099] [0099] A bar wrapping sequence is illustrated using Figures 16b to 16g as follows: [00100] [00100] Figure 16b shows step 1650 comprising folding vertical bar 1620 over a pivot point 1601 at the end of horizontal bar 1621. This can be achieved, for example, by means of a hydraulic cylinder drive although other mechanisms are known to those experts in the art can be considered as pulling wires and electronic drives. [00101] [00101] Step 1655, shown in Figure 16c, comprises the simultaneous folding of the horizontal bar 1621 and vertical bar 1620 over a pivot point 1602 which is positioned on top of the vertical support bar 1622. [00102] [00102] Step 1660, shown in Figure 16d, comprises lowering vertical support bar 1622 towards the rear of vehicle 1605. Vertical support bar 1622 can be folded down to a steep angle to allow space for an operator inspection booth be placed in the back of the vehicle. In another embodiment, vertical support bar 1622 can be folded down to be substantially parallel to the rear platform of the vehicle to allow for a compact system configuration which is advantageously designed to allow rapid relocation of systems using conventional air transport. [00103] [00103] Step 1665, shown in Figure 16e, comprises bending the base section 1625 of the imaging system by at least 90 degrees from its operating position. Thereafter, in step 1670, as shown in Figure 16f , it comprises bending the outer horizontal base section 1625a of the main base section 1625 by 180 degrees so that it is parallel with the inner base section 1625b. [00104] [00104] Finally, at step 1675, shown in Figure 16g a complete bending of the base section occurs by a 90 degree rotation to complete system wrapping. The above mentioned steps 1650 to 1675 for implanting bar to operating state of Figure 16a comprise steps of wrapping bar in reverse sequence. [00105] [00105] In alternative embodiments, the 1600 mobile inspection system is deployed with only the vertical and horizontal bars and not the lower imaging section. This gives dual sight imaging capability in the side sniper setup but no top sniper sight. In this mode, the system is capable of full scan triggering with an imaging configuration of at least one transmission view, with or without backscatter capability. [00106] [00106] The above examples are merely illustrative of the many applications of the system of the present invention. While only a few embodiments of the present invention have been described herein, it should be understood that the present invention may be embodied in many other specific ways without departing from the spirit or scope of the invention. Therefore, the present embodiments and examples are to be regarded as illustrative and not restrictive, and the invention may be modified within the scope of the appended claims.
权利要求:
Claims (1) [1] 1. X-ray inspection system for scanning an object, the inspection system characterized in that it comprises: at least two rotating X-ray sources configured to emit rotating X-ray beams simultaneously, each of the X-ray beams defining a transmission path; at least two detector arrays, wherein each of said at least two detector arrays is positioned opposite one of the at least two x-ray sources to form a scanning area; and at least one controller for controlling each of the X-ray sources to analyze the object in a coordinated manner such that X-ray beams from at least two X-ray sources do not cross transmission paths where each detector is a detector not pixelated. 2. X-ray inspection system, according to claim 1, characterized in that each of the emitted X-ray beams is a pencil beam and in which each X-ray source rotates along an angle of rotation predetermined. 3. X-ray inspection system, according to claim 1, characterized in that each detector is a non-pixeled detector. 43. X-ray inspection system, according to claim 1, characterized in that a first, a second and a third rotating X-ray source are configured to simultaneously emit rotating X-ray beams, in which the first source X-ray scans the object by starting in a substantially vertical position and moving in a clockwise manner; wherein the second X-ray source scans the object by starting in a substantially vertical downward position and moves in a clockwise fashion; and wherein the third X-ray source scans the object by starting in a substantially horizontal position and moving in a clockwise fashion. 54. X-ray inspection system, according to claim 1, characterized in that the controller causes each of the X-ray sources to start scanning the object, in a direction that does not overlap with an initial scan direction of any of the remaining X-ray sources, thus eliminating interference between the X-ray sources. 65. X-ray inspection system, according to claim 1, characterized in that a plurality of scanned views of the object are collected simultaneously with each of the detectors being irradiated by no more than one X-ray beam in any one time. 76. X-ray inspection system, according to claim 1, characterized in that a volume of one of the detectors is independent of a certain number of scanned views of the object obtained. 87. X-ray inspection system, according to claim 1, characterized in that the X-ray inspection system has an intrinsic spatial resolution and in which said intrinsic spatial resolution is determined by a certain degree of collimation of a X-ray beam. 98. X-ray inspection system according to claim 1, characterized in that the one or more detectors comprise an array of scintillating detectors having one or more photomultiplier tubes emerging from one end of the array of detectors to allow X-ray beams from adjacent X-ray sources pass an unobstructed face of the detector array in front of the photomultiplier tubes. 10. X-ray inspection system, according to claim 1, characterized in that the one or more detectors are formed from a bar of scintillation material that has a high light output efficiency, a time quick response and is mechanically stable over large volumes with little response to changing environmental conditions. 119. X-ray inspection system, according to claim 1, characterized in that the one or more detectors are gas ionization detectors comprising a Xenon or any other pressurized noble gas. 10. X-ray inspection system, according to claim 1, characterized by the fact that the noble gas is Xenon. 1211. X-ray inspection system, according to claim 1, characterized in that the one or more detectors are formed from a semiconductor material. 12. X-ray inspection system, according to claim 11, characterized in that the semiconductor material is selected from such as, but not limited to, CdZnTe, CdTe, HgI, Si and Ge. 13. X-ray inspection system, according to claim 1, characterized in that the X-ray inspection system is configured to detect gamma rays by turning off the X-ray sources by switching the detectors to an integration mode of current to a pulse counting mode. 14. X-ray inspection system for scanning an object, the inspection system characterized in that it comprises: at least two X-ray sources configured to simultaneously emit rotating X-ray beams to irradiate the object, each one of said X-ray beams defines a transmission path; a detector array comprising at least one transmission detector positioned between at least two backscatter detectors, wherein each of said backscatter detectors detects backscattered X-rays emitted by a first X-ray source positioned on a first side of the object and wherein the transmission detectors detect transmitted X-rays emitted by a second X-ray source positioned on an opposite side of the object; and at least one controller for controlling each of the X-ray sources to simultaneously scan the object in a coordinated, non-overlapping manner, such that the transmission paths of each of said X-ray beams do not cross where each detector is a non-pixeled detector. 15. X-ray inspection system, according to claim 14, characterized in that the detector array comprises at least two rectangular profile backscatter detectors and a square profile transmission detector positioned between said at least two detectors of rectangular profile backscatter. 16. X-ray inspection system, according to claim 14, characterized in that the array of detectors comprises a transmission detector positioned between two backscatter detectors and in which the detectors are positioned within a single facing plane. object being scanned and the transmission detector has a smaller exposed surface area than each of the backscatter detectors. 17. X-ray inspection system, according to claim 14, characterized in that it also comprises a pair of fixed collimators positioned between the transmission detector and one of said at least two backscatter detectors. 18. X-ray inspection system, according to claim 14, characterized in that each of the X-ray sources comprises an extended anode X-ray tube, a rotating collimator assembly, a bearing, a drive, and a rotary encoder. 19. X-ray inspection system, according to claim 14, characterized in that each X-ray source comprises: an extended anode X-ray tube coupled with a refrigeration circuit, the anode being potential of land; a rotating collimator assembly comprising at least one collimation ring with grooves cut at predefined angles around a circumference of the collimator, a length of each groove being greater than a groove width and axis of rotation, and the width of the grooves defining an intrinsic spatial resolution of the X-ray inspection system in the scan direction; a bearing for supporting a weight of the collimator assembly and transferring a drive shaft from the collimator assembly to a drive motor; a rotary encoder for determining an absolute angle of rotation of the x-ray beams; and a secondary collimator assembly to improve spatial resolution in a perpendicular scan direction. 20. X-ray inspection system, according to claim 19, characterized in that the controller receives velocity data comprising an object velocity and, based on said velocity data, adjusts at least one of a velocity of collimator rotation of an x-ray source, a data acquisition rate, or an x-ray tube stream based on data at said velocity.
类似技术:
公开号 | 公开日 | 专利标题 BR112014019198A2|2021-09-08|COMBINED TRANSMISSION AND STREAMING MULTI-VIEW IMAGING SYSTEM JP6525477B2|2019-06-05|X-ray inspection using wavelength-shifted fiber coupled scintillation detectors US9128198B2|2015-09-08|Time of flight backscatter imaging system RU2444723C2|2012-03-10|Apparatus and method of inspecting objects BR112012000884B1|2020-09-24|SCAN SYSTEM FOR LOAD INSPECTION, METHOD FOR INSPECTING A VEHICLE AND SCAN SYSTEM FOR INSPECTING A VEHICLE JP2015513072A5|2016-03-03| US8503606B2|2013-08-06|Low-cost position-sensitive X-ray detector CN102854208B|2014-10-01|Ray back scattering imaging system for discriminating depth information CN104285161A|2015-01-14|SPECT/PET imaging system
同族专利:
公开号 | 公开日 EP2810296A4|2015-12-30| IN2014DN06514A|2015-06-12| CA2863659C|2018-06-19| US9823201B2|2017-11-21| AU2013215064B2|2015-10-22| KR102065318B1|2020-01-10| CA2863659A1|2013-08-08| US20140044233A1|2014-02-13| EP2810296A1|2014-12-10| WO2013116549A1|2013-08-08| US9057679B2|2015-06-16| KR20190082995A|2019-07-10| HK1245995A1|2018-08-31| AU2013215064A1|2014-08-28| GB2513073B|2018-03-21| KR20140126318A|2014-10-30| GB201413876D0|2014-09-17| US20200355632A1|2020-11-12| MX2014009412A|2015-02-13| MX340345B|2016-07-05| KR101997948B1|2019-07-08| GB2513073A|2014-10-15| US20160025890A1|2016-01-28| JP6170070B2|2017-07-26| EP3242315A1|2017-11-08| JP2015513072A|2015-04-30| US10746674B2|2020-08-18| CN104170051A|2014-11-26| CN104170051B|2017-05-31| US20180313770A1|2018-11-01| EP3358597A1|2018-08-08|
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法律状态:
2018-12-04| B06F| Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]| 2019-12-31| B06U| Preliminary requirement: requests with searches performed by other patent offices: procedure suspended [chapter 6.21 patent gazette]| 2021-10-13| B07A| Application suspended after technical examination (opinion) [chapter 7.1 patent gazette]|
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申请号 | 申请日 | 专利标题 US201261594625P| true| 2012-02-03|2012-02-03| US61/594.625|2012-02-03| PCT/US2013/024191|WO2013116549A1|2012-02-03|2013-01-31|Combined scatter and transmission multi-view imaging system| 相关专利
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